May-Aug, 2000 — Dr. Simon Watkins Simon Fraser University, Burnaby, B.C.

  • Research Assistant: grew semiconductors by Metal-Organic Chemical Vapour Deposition (MOCVD)
  • Characterized them using the Hall effect, X-ray diffraction, atomic force microscopy, photoluminescence, and Raman scattering
  • Analysed and prepared data for presentation in 2 papers

This job was partially funded through the Natural Sciences and Engineering Research Council's (NSERC) Undergraduate Student Research Award program. In order to obtain this award, I had to find a professor at a Canadian University willing to employ me as a Research Assistant. I chose Simon Watkins at Simon Fraser University, as I had worked with him previously on my honours thesis. In fact, the work that I did in this job served as a continuation of some of the work I did for my honours thesis.

Most of my work on this job was in the characterization of semiconductors grown in the Metal-Organic Chemical Vapour Deposition (MOCVD) lab. The techniques I used were:

  • Hall effect measurement
  • photoluminescence
  • Raman scattering
  • X-ray diffraction
  • atomic force microscopy

I also had an opportunity to work with the MOCVD machine on the actual growth of these semiconductors. This consisted mostly of the growth of GaAsSb layers of various doping and thickness, lattice-matched to an InP substrate. The growth involved working with a large complicated machine, several toxic liquid chemicals, and several explosive and dangerous gases.

Some of my work at this job resulted in two papers:

  1. "Local vibrational modes of carbon in GaSb and GaAsSb"

    • Authors: X.K. Chen, R. Wiersma, C.X. Wang, O.J. Pitts, C. Dale, C.R. Bolognesi, S.P. Watkins
    • Location: Applied Physics Letters, vol. 80, pg. 1942 (2002)
    • File: PDF, 53 KB
  2. "Heavily carbon-doped GaAsSb grown on InP for HBT applications"

    • Authors: S.P. Watkins, O. Pitts, C. Dale, X.G.Xu, M. Dvorak, N. Matine, and C.R. Bolognesi
    • Location: Journal of Crystal Growth, 221, pg. 59 (2000)
    • File: PDF, 181 KB